Study On Character of Backstreaming Ions Source

LONG Ji-Dong; SHI Jin-Shui; YU Hai-Jun; LIN Yu-Zheng

Chinese Physics C> 2005, Vol. 29> Issue(5) : 501-506

Study On Character of Backstreaming Ions Source

Department of Engineering Physics of Tsinghua University,Beijing 100084,China2 China Academy of Engineering Physics,Mianyang 621900,China

Abstract
HTML
Reference
Related

PDF

Abstract：
Plasma could be produced when intense electron beams striking on converter target materials, such as Ta. The beam space charge may draw an ion current out of the plasma, which could substantially affect the final focus of beam on the target. This is called backstreaming ions effect. Since focus-spot is a key point for good radiography in X-ray machine research, the backstreaming ions effect gets much concerns. Based on our analyses, it is believed that generally the backstreaming ions are mainly from thermal desorption of contaminant on the Ta target surface. The ion emission is restricted by the space-charge effect, not by the ions source power.

References

[1]

.Welch D R,Hughes T P.Laser and Part icle Beam,1997,16( 2):285-2942.Kwan T J T,Snell C M,Christ enson P J.Physics of Plasmas,2000,7( 5):2215-22233.Kwan T J T.Simulat ions,Experiment s and Analysis of Beam Target In-teraction.Proceeding of the 1999 Part icle Accelerator Conf erence.NewYork,1999,1842-18444.Kwan T J T.IEEE Transact ions on Plasma Science,2000,28( 1):268-2705.CHEN Yu-Jiuan,Caporaso G J,Arthur C P.Controlling BackstreamingIons from X-Ray Converter Target s with Time Varying Final FocusingSolenoidal Lens and Beam Energy Variation.Proceedings of Linear Ac-celerator Conference.Chicago:NTIS,Springfield,VA,1998.472-4746.Caporaso G J,CHEN Yu-Jiuan.Analyt ic Model of Ion Emission fromthe Focus of an Intense Relativistic Elect ron Beam on a Target.Pro-ceedings of Linear Accelerator Conference.Chicago:NTIS,Springfield,VA,1998.830-8327.Sampayan S,Buckles R et al.Beam-Target Interaction Experiments for Bremsstrahlung Converter Applications.Proceedings of Particle Acceler-ator Conference.New York:IEEE,1999.1303-13058.Guethlein G et al.Faraday Cup Measurements of Ions Backst reaming in-to a Electron Beam Impinging on a Plasma Plume.Proceedings of LinearAccelerat or Conf erence.Mont erey,Cal ifornia,2000.467-4699.Sampayan S et al.Beam-Target Interaction Experiment s for BremsstrahlungConverter Applications.Proceedings of Part icle Accelerator Conference.Chicago:IEEE,2001.330-33210.Vermare C et al.Experimental Results of Electron Beam NeutralizationInduced by A Limited Space-Charge Emission.Proceedings of LinearAccelerat or Conf erence.Chicago:NTIS,Springfield,VA,1998,394-39611.Vermare C et al.Strong Self- Focusing of a 7.2 MeV Electron BeamStriking an Aluminized Mylar Target.IEEE Trans.Plasma Sci.,1999;27(6):1566-157112.CHEN S F.Time-Resolved Profile Measurements of High Current Shot-Pulse Electron-Beams.Post-Doct or Research Report,China Academicof Engineer Physics,2001.50-52 (in Chinese)(陈思富.强烈短脉冲电子束束剖面的时间分辨测量中国工程物理研究院流体物理研究所博士后研究工作报告,2001.50-52)13.Oliver B V et al.Beam-Target Int eract ions in Single and Mult i-PulseRadiography:UCRL-CR-134271.30-4314.Cuneo M E.IEEE Trans.On Dielectrics and Electrical Insulation,1999,6( 4):469-48515.Sanford T W L et al.J.Appl.Phys.,1989,66(1):10-2216.Cuneo M E.IEEE Trans.on Plasma Sci.,1987,15(4):375-38317.Swain D W et al.Journal of Applied Physics,1975,46:4604-460518.LONG J D,LIN Y Z et al.HEP NP,2004,28( 5):564-568 ( in Chinese)(龙继东,林郁正等.高能物理与核物理,2004,28 (5):564-568)19.Roth A.Vacuum Technology.Beijing:China Machine Press,1980.32 33,138-142(in Chinese)(A.罗斯.真空技术.北京:机械工业出版社,1980.32-33,138-142)20.WANG Yu-Zhi.Vacuum Technology.Chengdu:Publisher of SichuanPeople,1982.105,123(in Chinese)(王欲知.真空技术.成都:四川人民出版社,1982.105,123)21.Kim Y-K,Rudd M E.Phys.Rev.,1994,A50:3954 -396722.Kim Y-K,Santos J P,Parente F.Phys.Rev.,2001,A62:05271023.Pereira N R.IEEE Trans.on Plasma Sci.,1999,27(4):1169 -117424.YANG Jin-Ji.Gas Discharge.Beijing:Science Press,1983,106- 108(in Chinese)(杨津基.气体放电北京:科学出版社,1983.106-108)25.Weber B V,St ephanakis S J et al.Suppression of Ion Emission andPinching Using Heated Tantalum Anodes in High-Power Electron-BeamDiodes.Proceedings of BEAM.Nagaoka,Japan,2000.206 -20926.Weissler G L,Carlson R W.Vacuum Physics and Technology.Beijing:Atomi c Energy Press,1990.219(in Chinese)(G.L威斯勒,R.W卡尔森真空物理和技术.北京:原子能出版社,1990.219)

[1]	CUI Bao-Qun , TANG Bing , MA Yin-Jun , MA Rui-Gang , JIANG Cong , CHEN Li-Hua , JIANG Wei-Sheng . A Permanent Magnet Ion Source with Adjustable Magnetic Field. Chinese Physics C, 2008, 32(S1): 280-282.
[2]	CHEN Li-Hua , CUI Bao-Qun , JIANG Wei-Sheng , LI Ai-Ling . Calculation of Extraction System of Ion Sources. Chinese Physics C, 2008, 32(S1): 304-306.
[3]	ZOU Gui-Qing , ZHONG Guang-Wu , LEI Guang-Jiu , JIANG Shao-Feng , LU Da-Lun , CAO Jian-Yong , LIU He . Arc Discharge Performance Analysis for a High Power Bucket Ion Source. Chinese Physics C, 2008, 32(S1): 283-285.
[4]	P.Suominen , T , Ropponen , H.Koivisto . Modified Multipole Structure for Electron Cyclotron Resonance Ion Sources. Chinese Physics C, 2007, 31(S1): 142-146.
[5]	L.Celona¹ , F.Consoli¹ , S.Barbarino¹ , 2 , G.Ciavola¹ , S.Gammino¹ , F.Maimone³ , D.Mascali¹ , 2 , L.Tumino³ . Impact of Microwave Technology on ECRIS Performances. Chinese Physics C, 2007, 31(S1): 147-151.
[6]	D.Leitner , D.S.Todd , M.L.Galloway , C.M.Lyneis . Recent 28GHz Results with VENUS. Chinese Physics C, 2007, 31(S1): 1-7.
[7]	D.P.May , F.P.Abegglen , G.J.Derrig , R.S.Olsen . The Texas A&M 14.5 GHz ECRIS. Chinese Physics C, 2007, 31(S1): 105-107.
[8]	G.Ciavola¹ , S.Gammino¹ , L.Celona¹ , F.Consoli¹ , G.Gallo¹ , D.Mascali¹ , S.Passarello¹ , M.Cavenago² , A.Galatà² , P.Spaedtke³ , K.Tinschert³ , R.Lang³ , H.Koivisto⁴ , P.Suomin . Status Report of the MS-ECRIS Construction. Chinese Physics C, 2007, 31(S1): 13-17.
[9]	V.V.Bekhterev¹ , S.L.Bogomolov¹ , V.I.Datskov² , V.M.Drobin² , S.N.Dmitriev¹ , A.A.Efremov¹ , V.N.Loginov¹ , A.N.Lebedev¹ , H.Malinowski³ , V.V.Seleznev² , A.Shishov² , G.P.Tsvineva² . The Project of the Superconducting ECR Ion Source DECRIS-SC2. Chinese Physics C, 2007, 31(S1): 23-26.
[10]	R.Gobin , P-Y.Beauvais , A.Ben Ismail , D.Bogard , O.Delferriere , D.De Menezes , R.Duperrier , Y.Gauthier , F.Harrault , P-A.Leroy , O.Tuske , D.Uriot . ECR Light Ion Sources at CEA/Saclay. Chinese Physics C, 2007, 31(S1): 46-50.
[11]	M.Muramatsu¹ , 2 , A.Kitagawa² , Y.Iwata² , K.Yamamoto² , H.Ogawa² , S.Hojo² , Y.Sakamoto² , T.Honma² , W.Takasugi³ , M.Wakaisami³ , Y.Yoshida⁴ , T.Kubo⁵ , Y.Kato⁵ , S.Biri⁶ . Present Status of NIRS ECR Ion Sources. Chinese Physics C, 2007, 31(S1): 60-62.
[12]	SUN Zhen-Wu , HUO Yu-Ping , LI Yu-Xiao , LI Tao . Study of Extraction Property of RF Ion Source. Chinese Physics C, 2006, 30(9): 902-906.
[13]	LONG Ji-Dong , LIN Yu-Zheng , SHI Jin-Shui , YU Hai-Jun . A New Physical Image on Backstreaming Ions. Chinese Physics C, 2005, 29(12): 1185-1189.
[14]	ZHANG Zi-Min , ZHAO Hong-Wei , ZHANG Xue-Zhen , GUO Xiao-Hong , LI Xi-Xia , LI Jin-Yu , FENG Yu-Cheng , WANG Hui , MA Bao-Hua , GAO Ji-Yuan , CAO Yun , SUN Liang-Ting , MA Lei . High Charge State ECR Ion Source-LECR3. Chinese Physics C, 2003, 27(10): 914-918.
[15]	YANG Yong-Feng , ZHAO Zhi-Zheng , ZHENG Zhao-Miao , ZU Kai-Ling , WANG Xu-Dong , LIU Jun-Hui , ZHAO Xiao-Yan , WANG Tong-Qing , GUO Ying-Xiang , GUO Bin , LEI Xiang-Guo , JIN Gen-Ming , LUO Yi-Xiao , SHANG Ren-Cheng , XU Si-Da , . Results of the First On-line Experiment of the Laser Ion Source. Chinese Physics C, 2002, 26(2): 134-140.
[16]	ZHANG ZiMin , ZHAO HongWei , ZHAO YuBin , ZHANG XueZhen , GUO XiaoHong , LIU ZhanWen . Production of Metallic Ions Beam in ECR Ion Source. Chinese Physics C, 2000, 24(10): 974-978.
[17]	TAO XiaoPing , PENG ShiXiang . Experimental Study on a New LaMo Cathode of High Current Ion Source. Chinese Physics C, 2000, 24(8): 767-769.
[18]	Zhao Yubin , Liu Zhanwei , Zhao Hongwei , Ding Junzhang , Cao Yun , Zhang Zimin , Zhang Xuezhen , Guo Xiaohong . A Single Charge State ECR Ion Source. Chinese Physics C, 1999, 23(11): 1125-1128.
[19]	BAI Gui-Bin . A SMALL-SIZE ARC-DISCHARGE ION-SOURCE. Chinese Physics C, 1987, 11(2): 245-249.
[20]	MA MING-HSIU , YAO WEI , EAI KUEI-PEING . A NEW TYPE OF RADIOFREQUENCY METAL ION SOURCE. Chinese Physics C, 1978, 2(6): 544-549.

Access

Get Citation

LONG Ji-Dong, SHI Jin-Shui, YU Hai-Jun and LIN Yu-Zheng. Study On Character of Backstreaming Ions Source[J]. Chinese Physics C, 2005, 29(5): 501-506.

LONG Ji-Dong, SHI Jin-Shui, YU Hai-Jun and LIN Yu-Zheng. Study On Character of Backstreaming Ions Source[J]. Chinese Physics C, 2005, 29(5): 501-506. shu

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2004-07-19
Revised: 2004-09-07

Article Metric

Article Views(2728)
PDF Downloads(570)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, [email protected]

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Study On Character of Backstreaming Ions Source

Corresponding author: LIN Yu-Zheng,

Department of Engineering Physics of Tsinghua University,Beijing 100084,China2 China Academy of Engineering Physics,Mianyang 621900,China

Received Date: 2004-07-19

Accepted Date: 2004-09-07

Available Online: 2005-05-05

Abstract: Plasma could be produced when intense electron beams striking on converter target materials, such as Ta. The beam space charge may draw an ion current out of the plasma, which could substantially affect the final focus of beam on the target. This is called backstreaming ions effect. Since focus-spot is a key point for good radiography in X-ray machine research, the backstreaming ions effect gets much concerns. Based on our analyses, it is believed that generally the backstreaming ions are mainly from thermal desorption of contaminant on the Ta target surface. The ion emission is restricted by the space-charge effect, not by the ions source power.

HTML

Reference (1)

Study On Character of Backstreaming Ions Source

Abstract：

References

Access

Article Metrics

Metrics

通讯作者: 陈斌, [email protected]

Email This Article